Calculation of Hamaker Constants in Nonaqueous Fluid Media
نویسندگان
چکیده
منابع مشابه
Hamaker constants in integrated circuit metalization.
A new method for determining Hamaker constants was examined for materials of interest in integrated circuit manufacture. An ultra-high vacuum atomic force microscope and an atomic force microscope operated in a nitrogen environment were used to measure the interaction forces between metals, dielectrics, and barriers used during the metalization portion of integrated circuit manufacturing. The m...
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ژورنال
عنوان ژورنال: MRS Proceedings
سال: 2000
ISSN: 0272-9172,1946-4274
DOI: 10.1557/proc-625-129